DCG systems ELITE Lock-In Thermography tool installed at MASER Engineering

09 August 2013

MASER Engineering recently added a Lock-In Thermography (LIT) tool to her diagnostic services for thermal analysis (i.e. the DCG systems ELITE TDL 640 system). This tool is the first LIT system installation in an EMEA area ISP.

 DCG ELITE small.jpg

The ever increasing complexity of IC packages, in order to meet the need for more electronic functionality, raises the bar for physical failure analysis. These packages, sometimes containing multiple stacks of dies, can be an enormous challenge for root cause failure analysis of field returns or for yield improvements.

This ELITE system has the capability to detect small heat sources (e.g. short circuits) within the package while it is still intact. This type of non-destructive detection is even possible in stacks of multiple dies, as is often seen in SSD memory applications.
Common practice of physical failure analysis at MASER Engineering, after confirming the fault by electrical testing of the suspected defect device, is to start with a non-destructive approach by exposing the samples to 2D/3D X-Ray and Scanning Acoustic Microscopy (SAM) analysis. LIT can retrieve Z-axis information about the heat source by top and bottom imaging and phase analysis, which can guide the X-Ray and SAM analyses to localize package-related failures.
Besides package level fault localization, LIT can be used to localize chip level low-Ohmic defects that are often not found with Photon Emission Microscopy (PEM) or thermal laser-stimulated fault localization techniques (e.g. OBIRCH).
Another strong feature of the ELITE system is its thermal mapping ability, resulting in precise monitoring of absolute temperatures or temperature changes in and around a complex package without opening it, which allows precise verification of simulated temperature profiles within packages.


You can download here our Lock-In Thermography service leaflet.

More background information on LIT can be found in a recent publication and presentation.

For more information on the Lock-in Thermography test services at MASER Engineering, please contact Mr. Kees Revenberg or Mr. Ewald Reinders.