ESDA EOS/ESD Symposium

14 June 2016

MASER Engineering will be attending the ESDA EOS/ESD Symposium to be held on September 11-16, 2016 in
Garden Grove (Anaheim) USA. Marcel Dekker, Senior Reliability Test Engineer, will be joining the event and the paper on HMM Single Site Testing: Can We Reproduce Component Failure Level with the HMM Document? will be presented on September 13th, 2016.

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The EOS/ESD Symposium is focused on discussing the issues and providing the answers to electrostatic discharge in electronic production and assembly.
◾Gain beneficial electrostatic knowledge
◾Learn solutions to electrostatic issues and obstacles
◾Discover new and emerging technologies
◾Network with ESD professionals
◾Develop valuable peer and industry contacts

Sponsored by EOS/ESD Association  Co-sponsored by IEEE, The Electron Devices Society, EMC Society, and Reliability Society.

Symposium Technical Presentations

3B.3 HMM Single Site Testing: Can We Reproduce Component Failure Level with the HMM Document?
M. Scholz, imec; R. Ashton, ON Semiconductor; T. Smedes, R. Derikx, NXP Semiconductors; M. Dekker, MASER Engineering; J. Barth, Barth Electronics

The ESDA working group 5.6 has conducted single site testing to evaluate the repeatability of pass-fail results when using the setups in the standard practice 5.6 document. A ten times lower standard deviation is obtained in comparison to the 2011 round robin.

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