ESREF 2016

30 August 2016

ESREF 2016, the 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Halle (Saale), Germany from September 19th to 22nd, 2016.

The conference continues to focus on recent developments and future directions in quality, robustness and reliability research of materials, components, integrated electronic circuits/systems and their nano-, micro-, power-, optoelectronics devices. ESREF provides the leading European forum for developing all aspects of reliability management and failure prevention for present and future electronics. ESREF 2016 will have a specific focus on reliability issues in automotive electronics.

The conference will concentrate on electronic systems and devices with specific relevance for European and international industry, such as

  • Automotive electronics reliability (focus topic)
  • Reliability of nano- and microelectronics for the connected world
  • Reliability of power electronics for energy efficiency and industrial applications
  • Reliability of photonics and MEMS devices
  • Security and safety
  • Innovative failure diagnostics and quality control
  • Reliability concepts and modelling

MASER Engineering will be exhibiting on booth 15 and Kees Revenberg, Wilhelm Niessen and Thijs Kempers are looking forward to meet you.

JIACO Instruments will also be exhibiting on booth 15. Jiaqi Tang and Mark McKinnon will be presenting the JIACO Instruments MIP decapsulation system: Automated atmospheric pressure Microwave-Induced-Plasma (MIP) decapsulation utilising O2-only recipes.    

Monday, September 19, 2016 17:00 – 21:00
Tuesday, September 20, 2016 08:00 – 18:00
Wednesday, September 21, 2016 08:00 – 18:00
Thursday, September 22, 2016 08:00 – 15:30