Expansion of ISO-17025 scope with HTOL/LTOL/ELFR and PTC tests

10 February 2012

home_rva388.jpgMASER Engineering announces the expansion of the ISO/IEC 17025:2005 scope with HTOL, LTOL, ELFR and PTC tests. These tests are used to qualify semiconductors according to JESD47 and AEC-Q100.

  • High Temperature Operating Life (HTOL) according to JESD22-A108
  • Low Temperature Operating Life (LTOL) according to JESD22-A108
  • Early Life Failure Rate (ELFR) according to JESD22-A108
  • Power Temperature Cycle (PTC) according to JESD22-A105

Already a large amount of tests can be executed under ISO/IEC 17025:2005 accreditation e.g.:

  • High Temperature Storage Life (HTSL) according to JESD22-A103
  • Temperature Humidity Bias (THB) according to JESD22-A101
  • Highly Accelerated Temperature and Humidity Stress (HAST) according to JESD22-A110
  • Temperature Cycling (TC) according to JESD22-A104
  • Unbiased Temperature Humidity (UHAST) according to JESD22-A118
  • Unbiased Temperature Humidity (AC) according to JESD22-A102
  • Bond Pull Strength (BPS) according to MIL-STD-883 method 2011
  • Bond Shear (BS) according to JESD22-B116 / AEC-Q100-010
  • Solderball Shear (SBS) according to JESD22-B117 / AEC-Q100-001  

MASER Engineering has an ISO/IEC 17025:2005 accreditation which is valid until 1 October 2013 by the Dutch Accreditation Council RvA for the majority of the offered activities with accreditation L 388. The scope is also accessible on www.rva.nl (lab code L 388).

Further expansion of the ISO/IEC 17025:2005 scope is planned in 2012 for ESD and Latch-Up.