International Symposium for Testing and Failure Analysis (ISTFA) 2016

24 October 2016

On November 6-10, 2016 the International Symposium for Testing and Failure Analysis (ISTFA) 2016 will be held in Fort Worth, Texas, USA.

The ISTFA is one of the largest and leading events on Semiconductor Testing and Failure Analysis in the world.  

This year's theme is The Next Generation FA Engineer.

Change is the only constant in the Failure Analysis world. There is always the Next Generation technology to be understood, the Next Generation material to be learned, the Next Generation equipment to be mastered. In this changing world, the Next Generation constantly challenges the knowledge of today's engineers. The International Symposium for Testing and Failure Analysis (ISTFA) answers this challenge. At ISTFA, you can learn from the experts, network with people who can support your work, explore the latest apps and tools for the failure analysis lab, and become a knowable presenter yourself, teaching others. ISTFA offers opportunities for all levels of proficiency, from the Next Generation of engineers, who seek to boost their starting career, to expert engineers, who seek insight into Next Generation challenges already today.

MASER Engineering will exhibit together with Jiaco Instruments. Mr. Thijs Kempers (Sales Engineer) and Mr. Niels Banning (Advanced FA Engineer). 

ISTFA2016.jpg