LTX/Credence Diamond series D10 purchased for memory test

23 February 2012

MASER Engineering has purchased an LTX/Credence Diamond series D10 electrical test system. 

The first project with our launching customer will start beginning of April, 2012. The test interface will be supplied by our customer. The dual source flow at MASER Engineering will give the customer, working in the space environment, flexibility in testing and faster turn around time for lot acceptance testing (e.g. temperature cycling and HAST testing).

Salland Engineering is used as non-exclusive partner on Test Engineering H/W and S/W development and support for the Diamond D10 tester.

The Diamond test platform is a low-cost, high-throughput production test solution for cost-sensitive devices. Its small footprint, minimal facilities requirements and low power consumption drive down cost of operation, and make Diamond ideal for personal use in the lab or office. High-density digital and analog instruments are suitable for testing of DVD player/recorder, DTV and STB demodulators and decoders, baseband devices, PC peripheral SOCs as well as 8/16/32-bit microcontrollers. Diamond offers:

• Interchangeable instrument slots, allowing easy scaling from single to multisite and from digital only to mixed-signal configurations

• An ultra-small footprint, ideal for lab development or high-volume production

• 96-channel digital instruments featuring 200 Mbps operation with per-pin timing, formatting, levels and PMUs, along with scan and APG available on any channel

• DSP instrumentation with four channels each of analog source and measure for both audio and video applications, available in a single slot powerful mixed signal instrument

• High-density analog instruments with 16 or 72 channels of high-precision DPS, voltage/current source and measurement capabilities, enabling efficient, cost-effective multisite testing

Please see the leaflet for more detailed info.