Scanning Acoustic Microscopy systems upgraded at MASER Engineering

09 August 2013

MASER Engineering recently upgraded her Scanning Acoustic Microscopy (SAM) systems for non-destructive diagnostic services. In cooperation with PVA TePla, our SAMTEC Evolution II Ultrasonic Microscope systems were given a major upgrade (in Q2-2013), enabling faster and more accurate acoustic scans to better support our customers on the longer term.


The systems are already operational within MASER Engineering since 2007 and have grown to a well used non-destructive analysis tool for IC and PCB inspection and failure analysis.
The upgrade includes:

  • Large tray linear XY scanner motor
  • High speed A/D boards
  • Low-noise pre-amplifier
  • Switchable signal filter unit
  • Latest SAMnalysis software
  • PVA TePla built transducers

You can download here our non-destructive analysis service leaflet.

For more information on the SAM services at MASER Engineering, please contact Mr. Kees Revenberg.