ATHENIS workshop 2010

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At the public ATHENIS workshop “IC Technology for Harshest Automotive Applications”, which was held at the Fondazione Bruno Kessler on December 15th, 2010, in Povo (Trento, Italy), Mr. Kees Revenberg (Managing Director) of MASER Engineering presented a talk entitled:

Automotive Devices – Reliability test and Analysis facilities

Presentation Kees Revenberg

The presentation is available and can be downloaded here (in pdf).

For more information on this presentation and the reliability and analysis test services on automotive devices at MASER Engineering, please contact Mr. Kees Revenberg.


MASER Engineering participated in the European STREP / FP7-funded “ATHENIS” project, which is an acronym for “Automotive Tested High-voltage and Embedded Non-volatile memory Integrated System-on-Chip”. The ATHENIS consortium was formed with the purpose of developing the first automotive System-on-Chip (SoC) platform that enables highly-integrated products that can be operated under the harshest conditions known in the automotive industry. This includes full reverse polarity capability at the low cost of CMOS, application voltages up to 120 V, currents up to 10 A, temperatures up to 200 °C, embedded non-volatile memory, chip-level ESD up to >8 kV Human Body Model (HBM), and high logic gate densities. Duration of the project was 4 years (2008-2011).

More information on the ATHENIS project can be found here.


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