EOS/ESD 2010 paper

At the EOS/ESD 2010, a joint paper with contribution from Mr. Marcel Dekker (Senior Reliability Test Engineer) of MASER Engineering was presented by Mr. Theo Smedes. The EOS/ESD 2012, the 32nd IEEE Electrical Overstress / Electrical Discharge symposium organized by the Electrostatic Discharge Association (ESDA), took place in Reno (Nevada, USA) on October 3rd to 8th, 2010.

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Pitfalls for CDM calibration procedures

T. Smedes [1]; M. Polewski [1,2]; A. van IJzerloo [1]; J.L. Lefebvre [1,3] and M. Dekker [4]

  1. NXP Semiconductors, Nijmegen, the Netherlands
  2. Now with Thales, Hengelo, the Netherlands
  3. Now with Presto Engineering, Caen, France
  4. MASER Engineering, Enschede, the Netherlands


ABSTRACT

A product qualification gave very different results for CDM testing between 3 labs. This paper describes the investigation into the root cause of these differences. The most relevant issues are the measurement bandwidth and the quality of the calibration modules. An improved procedure is proposed.

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The entire paper (8 pages) can be found in the EOS/ESD 2010 symposium proceedings (link). More information on the EOS/ESD Symposium can be found here.

For more information on this paper and the ESD and Latch-Up test services at MASER Engineering, please contact Mr. Kees Revenberg or Mr. Marcel Dekker.