Electronic components, modules and systems are constructions of high complexity. During the manufacturing and operational life of these products, failures can occur. These can be classified as process yield related, first silicon defects, qualification test failures or customer field return devices. In all cases, MASER Engineering can support the design and quality engineering groups at the customer with a wide range of analytical skills and tools.

Our range of diagnostics services include:

  • Non Destructive Techniques
  • Sample Preparation
  • Fault Localisation
  • Optical Microscopy
  • Scanning Electron Microscopy
  • Scanning Transmission Electron Microscopy

You can download here your digital copy of our Diagnostics Service Leaflets.